Daftar Standar IEEE part 12-14

Daftar Standar IEEE part 12-14 adalah kumpulan judul standar IEEE dengan lingkup : Instrumentation and Measurement, Nanotechnology, National Electrical Safety Code (NESC).

Standar IEEE merupakan suatu standar yang diterbitkan oleh organisasi IEEE, yang penamaan nya diawali dengan kode “IEEE”.

IEEE SA (Standards Association) adalah organisasi pembangun konsensus terkemuka yang memelihara, mengembangkan, dan memajukan teknologi global, melalui IEEE.

Artikel ini adalah lanjutan dari artikel sebelumnya dari standarku.com mengenai organisasi IEEE SA berikut :

Jadi artikel ini ditujukan untuk membantu pembaca dalam mencari apa saja judul standar IEEE yang dibutuhkan.

Untuk mempermudah pencarian judul standar, disini kami cantumkan pembagian berdasarkan klasifikasi berikut.

Klasifikasi Standar IEEE

Standar IEEE dibagi menjadi 21 klasifikasi sebagaimana berikut :

  1. Aerospace Electronics
  2. Antennas and Propagation
  3. Batteries
  4. Blockchain
  5. Communications
  6. Computer Technology
  7. Consumer Electronics
  8. Electromagnetic Compatibility
  9. Green and Clean Technology
  10. Healthcare IT
  11. Industry Applications
  12. Instrumentation and Measurement
  13. Nanotechnology
  14. National Electrical Safety Code (NESC)
  15. Nuclear Power
  16. Power and Energy
  17. Power Electronics
  18. Smart Grid
  19. Software and Systems Engineering
  20. Transportation
  21. Wired and Wireless Communications

Dikarenakan standar IEEE sangat banyak jumlahnya, maka akan dibagi menjadi beberapa artikel seri Daftar Standar IEEE.

Pada artikel sebelumnya mencakup kategori yang ketujuh hingga kesebelas (part 7-11) yakni Consumer Electronics, Electromagnetic Compatibility, Green and Clean Technology, Healthcare IT, Industry Applications :

Pada artikel kali ini mencakup kategori yang ke 12 hingga ke 14 (part 12-14) yakni : Instrumentation and Measurement, Nanotechnology, National Electrical Safety Code (NESC).

Kategori lain akan dilanjutkan pada artikel dari standarku.com berikutnya.

Kolaborasi Organisasi Pengembang Standar

Pada beberapa judul artikel di kategori ini ada yang merupakan hasil kolaborasi antara IEEE dengan organisasi pengembang standar lain seperti :

  • ISO (International Organization for Standardization), adalah suatu organisasi atau lembaga nirlaba internasional, yang bertujuan untuk membuat dan memperkenalkan standar dan standardisasi internasional untuk berbagai tujuan.
  • IEC, adalah organisasi standardisasi internasional yang menyusun dan menerbitkan standar-standar internasional untuk seluruh bidang elektrik, elektronik dan teknologi yang terkait atau bidang teknologi elektro (electrotechnology).
  • ANSI (American National Standards Institute), adalah organisasi nirlaba swasta yang mengawasi pengembangan standar yang disetujui secara sukarela untuk produk, layanan, proses, sistem, dan personel di Amerika Serikat.

Seperti yang ditunjukkan pada judul dengan kode awalan nama gabungan sebagaimana berikut :

  • IEEE/IEC
  • IEEE/ISO/IEC
  • IEEE/ISO
  • IEEE/ANSI
  • ANSI/AAMI
  • IEEE/AIEE

Lebih jelas mengenai organisasi pengembang standar lain diatas dapat dibaca pada artikel lain dari standarku.com berikut :

Daftar Standar IEEE

Berikut adalah judul standar-standar IEEE part 12-14 yang dikutip dari ieee.org per 25 Agustus 2021 :

Daftar Standar IEEE Instrumentation and Measurement

  • IEEE 1522-2004 – IEEE Standard for Testability and Diagnosability Characteristics and Metrics
  • IEEE 1232-2010 – IEEE Standard for Artificial Intelligence Exchange and Service Tie to All Test Environments (AI-ESTATE)
  • IEEE 1636.2-2010 – IEEE Standard for Software Interface for Maintenance Information Collection and Analysis (SIMICA): Exchanging Maintenance Action Information via the Extensible Markup Language (XML)
  • IEEE 1445-2016 – IEEE Standard for Digital Test Interchange Format (DTIF)
  • IEEE 1636-2009 – IEEE Standard for Software Interface for Maintenance Information Collection and Analysis (SIMICA)
  • IEEE 1671-2006 – IEEE Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Equipment and Test Information via XML
  • IEEE 1671-2010 – IEEE Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Equipment and Test Information via XML
  • IEEE 1671.2-2008 – IEEE Trial-Use Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Equipment and Test Information via XML: Exchanging Instrument Descriptions
  • IEEE 1671.2-2012 – IEEE Standard for Automatic Test Markup Language (ATML) Instrument Description
  • IEEE 1671.4-2014 – IEEE Standard for Automatic Test Markup Language (ATML) Test Configuration
  • IEEE 1671.3-2007 – IEEE Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Information via XML (eXtensible Markup Language): Exchanging UUT (Unit Under Test) Description Information
  • IEEE 1671.4-2007 – IEEE Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Information via eXtensible Markup Language (XML): Exchanging Test Configuration Information
  • IEEE 1671.5-2008 – IEEE Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Information via XML:Exchanging Test Adapter Information
  • IEEE 1671.5-2015 – IEEE Standard for Automatic Test Markup Language (ATML) Test Adapter Description
  • IEEE 1671.6-2008 – IEEE Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Information via XML: Exchanging Test Station Information
  • IEEE 1671.6-2015 – IEEE Standard for Automatic Test Markup Language (ATML) Test Station Description
  • IEEE 716-1995 – IEEE Standard Test Language for All Systems – Common/Abbreviated Test Language for All Systems (C/ATLAS)
  • IEEE 1641-2010 – IEEE Standard for Signal and Test Definition
  • IEEE 1588-2002 – IEEE Standard for a Precision Clock Synchronization Protocol for Networked Measurement and Control Systems
  • IEEE 1641.1-2006 – IEEE Guide for the Use of IEEE Std 1641, Standard for Signal and Test Definition
  • IEEE 1641.1a-2018 – IEEE Guide for the Use of IEEE Std 1641(TM), IEEE Standard for Signal and Test Definition Amendment 1: Addition of Guidelines for Producing Reusable Test Signal Frameworks for Use on Platforms Utilizing Automatic Test Markup Language
  • IEEE 1671.1-2017 – IEEE Standard for Automatic Test Markup Language (ATML) Test Descriptions
  • IEEE 1671.3-2017 – IEEE Standard for Automatic Test Markup Language (ATML) Unit Under Test (UUT) Description
  • IEEE 1193-1994 – IEEE Guide for Measurement of Environmental Sensitivities of Standard Frequency Generators
  • IEEE 1193-2003 – IEEE Guide for Measurement of Environmental Sensitivities of Standard Frequency Generators
  • IEEE 488.2-1992 – IEEE Standard Codes, Formats, Protocols, and Common Commands for Use With IEEE Std 488.1-1987, IEEE Standard Digital Interface for Programmable Instrumentation
  • IEEE 4a-2001 – Amendment to IEEE Standard Techniques for High-Voltage Testing
  • IEEE 1505.1-2008 – IEEE Standard for the Common Test Interface Pin Map Configuration for High-Density, Single-Tier Electronics Test Requirements Utilizing IEEE Std 1505
  • IEEE 1122-1998 – IEEE Standard for Digital Recorders for Measurements in High-Voltage Impulse Tests
  • IEEE 1413-1998 – (Superseded) IEEE Standard Methodology for Reliability Predictions and Assessment for Electronic Systems Equipment
  • IEEE 1505.3-2015 – IEEE Standard for the Universal Test Interface Framework and Pin Configuration for Portable/Benchtop Test Requirements Utilizing IEEE 1505(TM) Receiver Fixture Interface Standard
  • IEEE 260.4-2018 – IEEE Standard for Letter Symbols and Abbreviations for Quantities Used in Acoustics
  • IEEE 1057-2007 – IEEE Standard for Digitizing Waveform Recorders
  • IEEE 1139-1988 – IEEE Standard Definitions of Physical Quantities for Fundamental Frequency and Time Metrology
  • IEEE 1149.8.1-2012 – IEEE Standard for Boundary-Scan-Based Stimulus of Interconnections to Passive and/or Active Components
  • IEEE 1505-2010 – IEEE Standard for Receiver Fixture Interface
  • IEEE 488.2-1987 – IEEE Standard Codes, Formats, Protocols, and Common Commands For Use with ANSI/IEEE Std 488.1-1987 IEEE Standard Digital Interface for Programmable Instrumentation
  • IEEE 1149.1-2013 – IEEE Standard for Test Access Port and Boundary-Scan Architecture
  • IEEE/IEC 63003-2015 – IEC/IEEE International standard for the common test interface pin map configuration for high-density, single-tier electronics test requirements utilizing IEEE Std 1505(TM)
  • IEEE 1413-2010 – IEEE Standard Framework for Reliability Prediction of Hardware
  • IEEE 1450.1-2005 – IEEE Standard for Extensions to Standard Test Interface Language (STIL) (IEEE Std 1450-1999) for Semiconductor Design Environments
  • IEEE 1858-2016 – IEEE Standard for Camera Phone Image Quality
  • IEEE 488.1-2003 – IEEE Standard For Higher Performance Protocol for the Standard Digital Interface for Programmable Instrumentation
  • IEEE/IEC 60488-1-2004 – IEC/IEEE International Standard – Higher Performance Protocol for the Standard Digital Interface for Programmable Instrumentation – Part 1: General
  • IEEE/IEC 63004-2015 – IEC/IEEE International standard for receiver fixture interface
  • IEEE 1332-2012 – IEEE Standard Reliability Program for the Development and Production of Electronic Products
  • IEEE 1057-2017 – IEEE Standard for Digitizing Waveform Recorders
  • IEEE 287-2007 – IEEE Standard for Precision Coaxial Connectors (DC to 110 GHz)
  • IEEE 62529-2012 – IEC 62529:2012(E) Standard for Signal and Test Definition
  • IEEE/IEC 62526-2007 – IEC 62526 Ed. 1 (IEEE Std 1450.1(TM)-2005): Standard for Extensions to Standard Test Interface Language (STIL) for Semiconductor Design Environments
  • IEEE 1057-1989 – IEEE Trial-Use Standard for Digitizing Waveform Recorders
  • IEEE 1241-2000 – IEEE Standard for Terminology and Test Methods for Analog-to-Digital Converters
  • IEEE 1241-2010 – IEEE Standard for Terminology and Test Methods for Analog-to-Digital Converters
  • IEEE 1450.6-2006 – IEEE Standard Test Interface Language (STIL) for Digital Test Vector Data-Core Test Language (CTL)
  • IEEE 1505.1-2019 – IEEE Standard for the Common Test Interface Pin Map Configuration for High-Density, Single-Tier Electronics Test Requirements Utilizing IEEE Std 1505
  • IEEE 1505.1-2019 – IEEE Standard for the Common Test Interface Pin Map Configuration for High-Density, Single-Tier Electronics Test Requirements Utilizing IEEE Std 1505
  • IEEE 1696-2013 – IEEE Standard for Terminology and Test Methods for Circuit Probes
  • IEEE 1804-2017 – IEEE Standard for Fault Accounting and Coverage Reporting(FACR) for Digital Modules
  • IEEE 1838-2019 – IEEE Standard for Test Access Architecture for Three-Dimensional Stacked Integrated Circuits
  • IEEE 1838-2019 – IEEE Standard for Test Access Architecture for Three-Dimensional Stacked Integrated Circuits
  • IEEE 1856-2017 – IEEE Standard Framework for Prognostics and Health Management of Electronic Systems
  • IEEE 1865-2019 – IEEE Standard Specifications for Maintenance and Test of Distributed Control Systems in Thermal Power Stations: General Requirements and Definitions
  • IEEE 1865.1-2019 – IEEE Standard Specifications for Maintenance and Test of Distributed Control Systems in Thermal Power Stations: Maintenance and Testing
  • IEEE 1865.1-2019 – IEEE Standard Specifications for Maintenance and Test of Distributed Control Systems in Thermal Power Stations: Maintenance and Testing
  • IEEE 1865.2-2019 – IEEE Standard Specifications for Maintenance and Test of Distributed Control Systems in Thermal Power Stations: Operation Service and Management
  • IEEE 1865.2-2019 – IEEE Standard Specifications for Maintenance and Test of Distributed Control Systems in Thermal Power Stations: Operation Service and Management
  • IEEE 746-1984 – IEEE Standard for Performance Measurements of A/D and D/A Converters for PCM Television Video Circuits
  • IEEE/IEC 62525-2007 – IEC/IEEE International Standard – Standard Test Interface Language (STIL) for Digital Test Vector Data
  • IEEE/IEC 62527-2007 – IEC 62527 Ed. 1 (IEEE Std 1450.2(TM)-2002): Standard for Extensions to Standard Test Interface Language (STIL) for DC Level Specification
  • IEEE 1450.6.2-2014 – IEEE Standard for Memory Modeling in Core Test Language
  • IEEE 544-1975 – IEEE Standard for Electrothermic Power Meters
  • IEEE 748-1979 – IEEE Standard for Spectrum Analyzers
  • IEEE/ANSI 91/91a-1991 – IEEE Standard Graphic Symbols for Logic Functions (Including and incorporating IEEE Std 91a-1991, Supplement to IEEE Standard Graphic Symbols for Logic Functions)
  • IEEE 1450.4-2017 – IEEE Standard for Extensions to Standard Test Interface Language (STIL) (IEEE Std 1450-1999) for Test Flow Specification
  • IEEE 3333.1.2-2017 – IEEE Standard for the Perceptual Quality Assessment of Three-Dimensional (3D) and Ultra-High-Definition (UHD) Contents
  • IEEE 2450-2019 – IEEE Standard for the Performance of Down-the-Road Radar Used in Traffic Speed Measurements
  • IEEE 2450-2019 – IEEE Standard for the Performance of Down-the-Road Radar Used in Traffic Speed Measurements
  • IEEE 1149.10-2017 – IEEE Standard for High-Speed Test Access Port and On-Chip Distribution Architecture
  • IEEE 1149.4-2010 – IEEE Standard for a Mixed-Signal Test Bus
  • IEEE 1451.3-2003 – IEEE Standard for a Smart Transducer Interface for Sensors and Actuators – Digital Communication and Transducer Electronic Data Sheet (TEDS) Formats for Distributed Multidrop Systems
  • IEEE 1451.4-2004 – IEEE Standard for A Smart Transducer Interface for Sensors and Actuators–Mixed-Mode Communication Protocols and Transducer Electronic Data Sheet (TEDS) Formats
  • IEEE 1505-2006 – IEEE Standard for Receiver Fixture Interface
  • IEEE 1588-2008 – IEEE Standard for a Precision Clock Synchronization Protocol for Networked Measurement and Control Systems
  • IEEE 1641-2004 – IEEE Standard for Signal and Test Definition
  • IEEE 181-1977 – IEEE Standard on Pulse Measurement and Analysis by Objective Techniques
  • IEEE 181-2003 – IEEE Standard on Transitions, Pulses, and Related Waveforms
  • IEEE 194-1977 – IEEE Standard Pulse Terms and Definitions
  • IEEE 218-1956 – IEEE Standard Methods of Testing Transistors
  • IEEE 2414-2020 – IEEE Standard for Jitter and Phase Noise
  • IEEE 260.1-2004 – IEEE Standard Letter Symbols for Units of Measurement (SI Customary Inch-Pound Units, and Certain Other Units)
  • IEEE 311-1970 – IEEE Standard Specification of General-Purpose Laboratory Cathode-Ray Oscilloscopes
  • IEEE 416-1984 – IEEE Standard ATLAS Test Language
  • IEEE 470-1972 – IEEE Standard Application Guide for Bolometric Power Meters
  • IEEE 474-1973 – IEEE Standard Specifications and Test Methods for Fixed and Variable Attenuators, DC-40 GHz
  • IEEE 488.1-1987 – IEEE Standard Digital Interface for Programmable Instrumentation
  • IEEE/IEC 62243-2002 – IEC/IEEE International Standard – Artificial intelligence exchange and service tie to all test environments (AI-ESTATE)
  • IEEE 1450.3-2007 – IEEE Standard for Extensions to Standard Test Interface Language (STIL) (IEEE Std. 1450-1999) for Tester Target Specification
  • IEEE 91/91a-1984 – IEEE Standard Graphic Symbols for Logic Functions (Including and incorporating IEEE Std 91a-1991, Supplement to IEEE Standard Graphic Symbols for Logic Functions)
  • IEEE/IEC 61671-6-2016 – IEC/IEEE International Standard – Standard for Automatic Test Markup Language (ATML) Test Station Description
  • IEEE 1451.7-2010 – IEEE Standard for Smart Transducer Interface for Sensors and Actuators–Transducers to Radio Frequency Identification (RFID) Systems Communication Protocols and Transducer Electronic Data Sheet Formats
  • IEEE 1450.6.1-2009 – IEEE Standard for Describing On-Chip Scan Compression
  • IEEE/ANSI 91a-1991 – IEEE Standard Graphic Symbols for Logic Functions (Including and incorporating IEEE Std 91a-1991, Supplement to IEEE Standard Graphic Symbols for Logic Functions)
  • ANSI/IEEE 176-1978 – IEEE Standard On piezoelectricity
  • ANSI/IEEE 488-1978 – IEEE Standard Digital Interface for Programmable Instrumentation
  • IEEE 1139-2008 – IEEE Standard Definitions of Physical Quantities for Fundamental Frequency and Time Metrology–Random Instabilities
  • IEEE 1149.1-1990 – IEEE Standard Test Access Port and Boundary-Scan Architecture
  • IEEE 1149.1-2001 – IEEE Standard Test Access Port and Boundary Scan Architecture
  • IEEE 1149.6-2015 – IEEE Standard for Boundary-Scan Testing of Advanced Digital Networks
  • IEEE 1149.7-2009 – IEEE Standard for Reduced-Pin and Enhanced-Functionality Test Access Port and Boundary-Scan Architecture
  • IEEE 1174-2000 – IEEE Standard Serial Interface for Programmable Instrumentation
  • IEEE 1226-1998 – IEEE Standard for a Broad-Based Environment for Test (ABBET(TM)), Overview and Architecture
  • IEEE 1451.1-1999 – IEEE Standard for a Smart Transducer Interface for Sensors and Actuators – Network Capable Application Processor Information Model
  • IEEE 1451.2-1997 – IEEE Standard for a Smart Transducer Interface for Sensors and Actuators – Transducer to Microprocessor Communication Protocols and Transducer Electronic Data Sheet (TEDS) Formats
  • IEEE 1451.5-2007 – IEEE Standard for a Smart Transducer Interface for Sensors and Actuator — Wireless Communication Protocols and Transducer Electronic Data Sheet (TEDS) Formats
  • IEEE 1500-2005 – IEEE Standard Testability Method for Embedded Core-based Integrated Circuits
  • IEEE 1687-2014 – IEEE Standard for Access and Control of Instrumentation Embedded within a Semiconductor Device
  • IEEE 181-2011 – IEEE Standard for Transitions, Pulses, and Related Waveforms
  • IEEE 1851-2012 – IEEE Standard for Design Criteria of Integrated Sensor-Based Test Applications for Household Appliances
  • IEEE 1851-2012 – IEEE Standard for Design Criteria of Integrated Sensor-Based Test Applications for Household Appliances
  • IEEE 200-1975 – IEEE Standard Reference Designations for Electrical and Electronics Parts and Equipments
  • IEEE 21451-1-2010 – ISO/IEC/IEEE Standard for Information technology — Smart transducer interface for sensors and actuators — Part 1: Network Capable Application Processor (NCAP) information model
  • IEEE 21451-4-2010 – ISO/IEC/IEEE Standard for Information technology — Smart transducer interface for sensors and actuators — Part 4: Mixed-mode communication protocols and Transducer Electronic Data Sheet (TEDS) formats
  • IEEE 2402-2017 – IEEE Standard Design Criteria of Complex Virtual Instruments for Ocean Observation
  • IEEE 260.4-1996 – American National Standard Letter Symbols and Abbreviations for Quantities Used in Acoustics
  • IEEE 268-1979 – IEEE Standard Metric Practice
  • IEEE 268-1982 – IEEE Standard Metric Practice
  • IEEE 280-2021 – IEEE Approved Draft Standard Letter Symbols for Quantities Used in Electrical Science and Electrical Engineering
  • IEEE 4-1978 – IEEE Standard Techniques for High Voltage Testing
  • IEEE 586-1980 – IEEE Standard Definitions of Laser-Maser Terms
  • IEEE 660-1986 – IEEE Standard for Semiconductor Memory Test Pattern Language
  • IEEE/ANSI 315-1975 – IEEE Standard for Graphic Symbols for Electrical and Electronics Diagrams (Including Reference Designation Letters)
  • IEEE/ANSI 460-1988 – IEEE Standard for Electrical Measuring Transducer for Converting AC Electrical Quantities into DC Electrical Quantities
  • IEEE/ASTM 268-1976 – IEEE/ASTM Standard Metric Practice
  • IEEE/IEC 60488-2-2004 – IEC/IEEE International – Standard Digital Interface for Programmable Instrumentation – Part 2: Codes, formats, protocols and common commands
  • IEEE/ISO/IEC 21451-2-2010 – ISO/IEC/IEEE International Standard for Information technology — Smart transducer interface for sensors and actuators — Part 2: Transducer to microprocessor communication protocols and Transducer Electronic Data Sheet (TEDS) formats
  • IEEE 1226-1993 – IEEE ABBET(TM) Trial-Use Standard for A Broad-Based Environment for Test (ABBET) Overview and Architecture
  • IEEE 1149.1a-1993 – Supplement to Standard Test Access Port and Boundary-Scan Architecture (1149.1)
  • IEEE 270-2006 – IEEE Standard Definitions for Selected Quantities, Units, and Related Terms, with Special Attention to the International System of Units (SI)
  • IEEE C12.1-1988 – American National Standard Code for Electricity Metering
  • IEEE C12.10-1987 – American National Standard for Electromechanical Watthour Meters
  • IEEE C12.8-1981 – American National Standard for Test Blocks and Cabinets for Installation of Self-Contained A-Base Watthour Meters
  • IEEE 1541-2002 – IEEE Standard for Prefixes for Binary Multiples
  • AIEE 2-1929 – A.I.E.E. Revised Report on Standard Definitions and Symbols
  • IEEE 1057-1994 – IEEE Standard for Digitizing Waveform Recorders
  • IEEE 1122-1987 – IEEE Standard for Digital Recorders for Measurements in High-Voltage Impulse Tests
  • IEEE 118-1978 – IEEE Standard Test Code for Resistance Measurement
  • IEEE 1377-1997 – IEEE Standard for Utility Industry End Device Data Tables
  • IEEE 1545-1999 – IEEE Standard for Parametric Data Log Format
  • IEEE 1624-2008 – IEEE Standard for Organizational Reliability Capability
  • IEEE 1658-2011 – IEEE Standard for Terminology and Test Methods of Digital-to-Analog Converter Devices
  • IEEE 191-1953 – IEEE Standard on Sound Recording and Reproducing Methods of Measurement of Noise
  • IEEE 260-1978 – IEEE Standard Letter Symbols for Units of Measurement (SI Units, Customary Inch-Pound Units, and Certain Other Units)
  • IEEE 260.1-1993 – American National Standard Letter Symbols for Units of Measurement (SI Units, Customary Inch-Pound Units, and Certain Other Units)
  • IEEE 260.3-1993 – American National Standard Mathematical Signs and Symbols for Use in Physical Sciences and Technology
  • IEEE 268-1992 – American National Standard for Metric Practice
  • IEEE 662-1980 – IEEE Standard Terminology for Semiconductor Memory
  • IEEE 662-1992 – IEEE Standard Terminology for Semiconductor Memory
  • IEEE N323AB-2013 – American National Standard for Radiation Protection Instrumentation Test and Calibration, Portable Survey Instruments
  • IEEE/ASTM SI 10-2016 – American National Standard for Metric Practice
  • IEEE/IEC 61671-5-2016 – IEC/IEEE International Standard – Automatic Test Markup Language (ATML) Test Adapter Description
  • 1139-1999 – Standard Definitions of Physical Quantities for Fundamental Frequency and Time Metrology – Random Instabilities
  • IEEE C12.11-1987 – American National Standard for Instrument Transformers for Revenue Metering, 10 kV BIL Through 350 kV BIL (0.6 kV NSV through 69 kV NSV)
  • IEEE C12.13-1991 – American National Standard for Electronic Time-of-Use Registers for Electricity Meters
  • IEEE C12.14-1982 – American National Standard for Magnetic Tape Pulse Recorders for Electricity Meters
  • IEEE C12.17-1991 – American National Standard for Cartridge-Type Solid-State Pulse Recorders for Electricity Metering
  • IEEE C12.4-1984 – American National Standard for Mechanical Demand Registers
  • IEEE C12.6-1987 – American National Standard for Marking and Arrangement of Terminals for Phase-Shifting Devices Used in Metering
  • IEEE C12.7-1993 – American National Standard Requirements for Watthour Meter Sockets
  • IEEE C12.9-1993 – American National Standard for Test Switches for Transformer-Rated Meters
  • IEEE 314-1971 – IEEE Standards Report on State of the Art of Measuring Unbalanced Transmission-Line Impedance
  • IEEE/ANSI 285-1968 – IEEE Standards Report on State-of-the-Art of Measuring Phase Shift at Frequencies above 1 Ghz
  • IEEE/AIEE 33-1927 – AIEE Standards – Electrical Measuring Instruments
  • IEEE 284-1968 – IEEE Standards Report on State-of-the-Art of Measuring Field Strength, Continuous Wave, Sinusoidal
  • IEEE 1232.3-2014 – IEEE Guide for the Use of Artificial Intelligence Exchange and Service Tie to All Test Environments (AI-ESTATE)
  • IEEE 61671-2012 – IEC 61671:2012(E) (IEEE Std 1671-2010) Automatic Test Markup Language (ATML) for Exchanging Automatic Test Equipment and Test Information via XML
  • IEEE 1871.1-2014 – IEEE Recommended Practice for Using IEEE 1671.2(TM) Instrument Description Templates for Describing Synthetic Instrumentation for Classes of Instruments such as Waveform Generators, Digitizers, External Oscillators, and Up and Down Converters
  • IEEE 62243-2010 – IEC 62243:2012(E) (IEEE Std 1232-2010): Artificial Intelligence Exchange and Service Tie to All Test Environments (AI-ESTATE)
  • IEEE 287-1968 – Precision Coaxial Connectors
  • IEEE 1460-1996 – IEEE Guide for the Measurement of Quasi-Static Magnetic and Electric Fields
  • IEEE 790-1989 – IEEE Guide for Medical Ultrasound Field Parameter Measurements
  • IEEE 1871.2-2017 – IEEE Recommended Practice for IEEE 1671 Test Equipment Templates and Extension Classes for Describing Intrinsic Signal Path Information for Cables, Interface Adapters, and Test Equipment
  • IEEE 21450-2010 – Information technology — Smart transducer interface for sensors and actuators — Common functions, communication protocols, and Transducer Electronic Data Sheet (TEDS) formats
  • IEEE 268-1973 – IEEE Recommended Practice for Units in Published Scientific and Technical Work
  • IEEE 3-1982 – IEEE Recommended Practice in the Selection of Reference Ambient Conditions for Test Measurements of Electrical Apparatus
  • ASA C12.90-1965 – ASA/IEEE Test Code for Distribution, Power, and Regulating Transformers, and Shunt Reactors
  • IEEE 101A-1974 – IEEE Simplified Method for Calculation of the Regression Line (Appendix to IEEE Guide for the Statistical Analysis of Thermal Life Test Data, IEEE Std 101-1972)
  • IEEE 1413.1-2002 – IEEE Guide for Selecting and Using Reliability Predictions Based on IEEE 1413
  • IEEE 1783-2009 – IEEE Guide for Test Methods and Procedures to Evaluate the Electrical Performance of Insulators in Freezing Conditions
  • IEEE 257-1964 – IEEE Technical Committee Report on Recommended Practices for Burst Measurements in the Time Domain
  • IEEE 268-1966 – IEEE Recommended Practice for Units in Published Scientific and technical Work
  • IEEE 454-1973 – IEEE Recommended Practice for the Detection and Measurement of Partial Discharges (Corona) During Dielectric Tests
  • IEEE 771-1989 – IEEE Guide to the Use of the ATLAS Specification
  • IEEE 945-2019 – IEEE Recommended Practice for Preferred Metric Units for Use in Electrical and Electronics Science and Technology
  • IEEE/AIEE 451-1955 – AIEE Proposed Recommended Guide for Specification of Signal Sources
  • IEEE 110 –
  • IEEE 178 –
  • IEEE 179 –
  • IEEE 197 –
  • IEEE 198 –
  • IEEE 268A-1987 – IEEE International System of Units Conversion Factors Card
  • IEEE 294 –
  • IEEE 427 –
  • IEEE 448 –
  • IEEE 481 –
  • IEEE 489 –
  • IEEE 491 –
  • IEEE 571 –
  • IEEE 698 –
  • IEEE 831 –
  • IEEE 942 – Digital Semiconductor/Program Language
  • IEEE 992 –
  • IEEE 994 –

Daftar Standar IEEE Nanotechnology

  • IEEE 1650-2005 – IEEE Standard Test Methods for Measurement of Electrical Properties of Carbon Nanotubes
  • IEEE 62659-2015 – IEC/IEEE International Standard – Nanomanufacturing — Large scale manufacturing for nanoelectronics
  • IEEE 1620-2008 – IEEE Standard for Test Methods for the Characterization of Organic Transistors and Materials
  • IEEE/IEC 61588-2021 – IEC/IEEE International Standard – Precision Clock Synchronization Protocol for Networked Measurement and Control Systems
  • IEEE 1906.1-2015 – IEEE Recommended Practice for Nanoscale and Molecular Communication Framework
  • IEEE 62624-2009 – Test methods for measurement of electrical properties of carbon nanotubes

Daftar Standar IEEE National Electrical Safety Code (NESC)

  • IEEE NESC HBK-2017 – 2017 NESC(R) Handbook, Premier Edition
  • IEEE C2 – Preprint Proposals for the 2022 Edition of the National Electrical Safety Code(R)(NESC(R))
  • IEEE White Paper-0 – Visioning Sessions Output at the 2015 NESC Summit: Future of the NESC, the NESC Process, and Design Versus Safety
  • IEEE C2-1997 – 1997 National Electrical Safety Code(R) Diskette package
  • IEEE C2-2004 – National Electrical Safety Code┬« (NESC) The Archives: 1973 – 2000 (Single User)
  • IEEE C2-2007 -2006 – NESC VuSpec and PDF Pro Edition [Network License]

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Demikian artikel dari standarku.com mengenai Daftar Standar IEEE kategori yang ke 12 hingga ke 14 (part 12-14) yakni : Instrumentation and Measurement, Nanotechnology, National Electrical Safety Code (NESC).

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